Verneuil Synthetic Sapphire Inclusions
Explore Sapphire inclusions in Hyperion, the Lotus Gemology inclusion database. Hyperion contains photomicrographs of inclusions and internal features in natural and synthetic Sapphire, documented with information on geographic origin, treatment, lighting conditions, field of view, photographer and published references.
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Verneuil Synthetic Sapphire inclusions may include curved striae, curved color banding, gas bubbles, healed fissures, Plato lines, twinning, and other features formed during or after crystal growth. Such features are important to gemologists because they can provide evidence useful in identifying Sapphire, understanding its geological history, recognizing treatment and, in some cases, determining geographic origin.
Verneuil Synthetic Sapphire Inclusion Photomicrographs
The Hyperion Verneuil synthetic sapphire gallery includes microscopic features found in rubies from major deposits around the world. Each entry is accompanied by descriptive information and, where available, references to the gemological literature.
What Inclusions Can Reveal About Verneuil Synthetic Sapphire
Inclusions are an important part of sapphire identification. Their form, composition, orientation and alteration can help gemologists distinguish natural Sapphire from Verneuil Synthetic material, recognize evidence of heat treatment, and study the geological environment in which the sapphire formed.
Hyperion combines inclusion photomicrography with supporting gemological information so that individual features can be compared with documented examples from known natural sapphire deposits and synthetic rubies.
About Hyperion
Hyperion is the Lotus Gemology searchable inclusion database. It allows users to browse gemstone inclusions by gem type, geographic origin, treatment and keyword.